log tests/test-convert-svn-source.t @ 13162:115a9760c382

age author description
Wed, 22 Sep 2010 18:20:47 -0500 Matt Mackall tests: various fixes for new unified test pattern format
Tue, 21 Sep 2010 18:40:33 +0200 Dan Villiom Podlaski Christiansen tests: unify test-convert-svn-* base tests/test-convert-svn-source@b1539f9722ab